TDA.GUI
WinForms visualization controls for semiconductor test data. Includes trend charts, histograms (4 binning methods), box plots, cumulative probability plots (Normal/LogNormal/Weibull), wafer maps with color-coded bin visualization, chart linking, and a high-performance virtual data grid — built on ScottPlot and SkiaSharp.
Activity
- Latest release
- 1w ago
- Total releases
- 3
- Cadence
- ~18 days
- Last 12 months
- 3
Details
- First release
- Jul 29, 2026
| Version | Released | |
|---|---|---|
2.1.1
patch
|
2.1.1
patch
Dependencies (6)
|
|
2.1.0
minor
|
2.1.0
minor
Dependencies (6)
|
|
2.0.1
initial
|
2.0.1
initial
Dependencies (6)
|