TDA
Core library for semiconductor production test data analysis. Provides STDF V4 record-level parsing, multi-sublot and retest data correlation, parallel statistical analysis (Cp/Cpk, distributions), DeviceID tracking, and NEDA CSV / Excel import/export.
Activity
- Latest release
- 1w ago
- Total releases
- 4
- Cadence
- ~daily
- Last 12 months
- 4
Details
- First release
- Jul 29, 2026
| Version | Released | |
|---|---|---|
2.1.2
patch
|
2.1.2
patch
Dependencies (8)
|
|
2.1.1
patch
|
2.1.1
patch
Dependencies (8)
|
|
2.1.0
minor
|
2.1.0
minor
Dependencies (8)
|
|
2.0.1
initial
|
2.0.1
initial
Dependencies (8)
|